State-of-the-art optics for materials science and life sciences
VEGA 4th generation Scanning Electron Microscope (SEM) from TESCAN has with tungsten filament electron source that combines SEM imaging and live elemental composition analysis using the TESCAN’s Essence™ software for the cquisition of both morphological and elemental data from the sample. Perfect for routine materials characterization, research and quality control applications at the micron scale.
CLARA from TESCAN Field-Free analytical UHR SEM for materials characterization at nanoscale is designed with unique In-Beam BSE detector that allow filtering of signal based on energy and take off angle. The Axial BSE detector collects narrow-angle backscattered electrons while the Multidetector (BSE) collects mid-angle backscattered electrons.
TESCAN MIRA’s 4th generation SEM with FEG Schottky electron emission source. It significantly simplifies acquisition of both morphological and elemental data from the sample, making MIRA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs.
MAGNA from TESCAN is unique tool for ultimate surface characterization of nanomaterials. It features the Triglav™ SEM column for excellent ultra-high-resolution imaging performance for low electron beam energies. MAGNA operates with a Schottky field electron source, capable of generating high electron beam currents up to 400 nA with Essence™ graphical user interface.