Home » Products » Scanning Electron Microscopy » FIB-SEM (Ga and Xe plasma) » Tescan AMBER for Material Science
FIB-SEM
Amber from TESCAN comes with high precision micro sample preparation and ultra-high resolution field-free SEM imaging and nanoanalysis. The Extended field of view provide easy navigation Multi-site process automation. AMBER FIB-SEM is a multi-modal FIB-SEM tomography and has an easy-to-use modular software user interface
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