AFM-Raman Spectrometry
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Tip Enhanced Raman Spectroscopy (TERS)
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Horiba AFM-Raman Spectrometry
HORIBA is now basing their analysis on Tip Enhanced Raman Spectroscopy (TERS) where imagin takes nanoscale level. In TERS a Scanning Probe microscope (SPM) is integrated with a confocal Raman spectrometer through an opto-mechanical coupling which therefore allows for nanoscale imaging, the optical coupling brings the excitation laser to the functionalized tip (or probe), and the spectrometer analyzes the Raman. Two different configurations exist for the TERS optical coupling one in transmission based on a bottom illumination-collection with high NA objective and one in “top” and the “side” reflection.
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