CLARA for Material Science


Imaging of beam-sensitive and non-conductive samples

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Tescan CLARA for Material Science

TESCAN CLARA is excellent for imaging of beam-sensitive and non-conductive samples for which the fast setup of electron beam optimal imaging and analytical conditions are guaranteed. It performs UHR Field-free characterization of materials at low beam energies for maximum topography.  CLARA has an Intuitive and precise live SEM navigation on the sample at low magnification without the need of optical navigation camera as besides the Intuitive Essence™ software modular platform designed for effortless operation regardless of the user's skill level.