Explore the future
Atomic Force Microscope Raman from HORIBA opens new capabilities and provides more information on sample composition and structure. AFM RAMAN provides topographic, thermal, mechanical, magnetic and electrical properties down to the molecular resolution by collecting physical and chemical information on the same sample area. AFM RAMAN performs TERS imaging; TERS (Tip Enhanced Raman Spectroscopy) brings Raman spectroscopy into nanoscale resolution imaging which is based on a metallic tip employed to concentrate the incident light field at the apex.
Raman Spectroscopy from Horiba is considered a non-destructive chemical analysis technique that provides detailed physical properties such as the chemical structure, crystallinity and molecular interactions based on the analysis of the interaction of light with the chemical bonds within a material. It features a number of peaks that shows the intensity and wavelength position of the Raman scattered light. These peaks correspond to specific molecular bonds vibration either singular bonds like simple two carbon bond or groups of bonds like benzene ring.
Cathodoluminescence Universal Extension (CLUE) systems from HORIBA provide high resolution spectral information with the spatial resolution of an electron probe. These systems feature the widest spectral range available (UV-VIS to IR), fast CL imaging .for detecting trace elements.
CL is an essential non-destructive analytical technique useful in a wide range of applications such as semiconductors, optoelectronics, dielectrics and ceramics. and in geology, mineralogy, forensics, and life sciences investigations.
X-ray Fluorescence (XRF) instruments from HORIBA deliver high performance solutions for spatially resolved XRF analysis with analysis spot sizes as low as 10 µm. Two main XRF methodologies are available; Energy Dispersive (EDXRF) and Wavelength Dispersive (WDXRF) where Each method has its own advantages and disadvantages. XRF is perfect for fast characterization for multiple applications such as metallurgy, forensics, environmental analysis, geology... etc. This devive is well developed to be capable of high spatial resolution analysis.
Fluorescence spectroscopy collects fluorescent properties in a molecule and analyzes its fluorescence by exciting the molecule raising it to an electronic excited state and eventually emitting light. That light is directed towards a filter and onto a detector for measurement and identification of the molecule or changes in this molecule. There are several types of fluorescence energy such as light energy, chemical energy, electrical energy and light energy fluorescence that also includes energy transfer and heat loss.
Spectroscopic ellipsometry from HORIBA is a surface-sensitive, non-destructive, non-intrusive optical technique perfect for thin layers and surface characterization. This technique is mainly based on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, this technique can measure thickness from a few Å to tens of microns. Spectroscopic ellipsometry allows a range of thin film properties to be characterized, like layer thickness, optical properties (n,k).
HORIBA has developed a new compact Vacuum ultra Violet (VUV) sources and applications that requires compact VUV monochromators. It is ideal for application such as Extreme UV lithography or soft X-ray. The large offer of monochromators proposes a wide range of fully integrated VUV systems. Vacuum Ultra Violet Spectroscopy systems are provided with sources, sample chambers, monochromators and detection and are controlled by HORIBA software. Based on modularity designs different configurations can be realized to fulfill your particular application.
Dynamic light scattering (DLS) technique needs only a single device to analyze the three parameters that characterize nanoparticles: particle size, zeta potential, and molecular weight. It measures the fluctuations in scattered light intensity with time. These fluctuations in intensity arise due to the random Brownian motion of nanoparticles. The statistical behavior of these fluctuations in scattered intensity can be related to the diffusion of the particles. One can readily relate particle size to measured fluctuations in light scattering intensity.
The SZ-100 Nanoparticle Analyzer can be used in to measure the molecular weight of proteins, starches, polymers, and dendrimers for many applications like cosmetics, metal powder, protein and protein aggregation, polymers and plastics, ceramics and cement manufacturing. The data can be obtained by two different methods, dynamic light scattering and static light scattering. The advantages of this technique are that polymer concentration need not be well known and it is very fast.
Raman Scattering from HORIBA is based on an incident light scattered by a molecule from a high intensity laser light source. Most of the scattered light is at the same wavelength (or color) as the laser source and does not provide useful information – The Rayleigh Scatter. However a small amount of light (typically 0.0000001%) is scattered at different wavelengths (or colors), which depend on the chemical structure of the analyte – this is called Raman Scatter.
Static Light Scattering (SLS) /Laser Diffraction Particle Size Distribution Analysis from HORIBA has multiple analytical techniques that use light scattering phenomena to probe a sample. It is summerized by the relationship between particle size and the angle and intensity of scattered light. Light scatters more intensely and at smaller angles off of large particles. Laser diffraction measures the angle and intensity of light scattered from the particles in your sample. SLS is also used to detect particles on surfaces such as masks used in semiconductor.
Zeta potential is the charge on a particle at the shear plane. This surface charge is useful for understanding & predicting interactions between particles in suspension. Manipulating zeta potential is a method of enhancing suspension stability for formulation work, or speeding particle flocculation. Measuring zeta potential by electrophoretic light scattering allows one to assess the effects of various strategies for manipulating zeta potential. Electrophoretic light scattering reveals that a charged particle responds to an applied electric field.
HORIBA Scientific pulsed RF GDOES instruments are ideal companion characterization tools to material research and elaboration. The new RF pulsed source allows measuring all types of solid samples conductive or non, even fragile or heat sensitive with optimum performances. The patented High Dynamic range Detectors (HDD) used in all HORIBA Scientific GD instruments allow real time, automatic optimization of the sensitivity permitting to analyze elements at trace levels in one layer and as major in a second layer without compromise or need of pre-adjustment.
Elemental analysis - ICP-OES (ICP-OES) spectrometers from HORIBA measure elements concentrations in ppb to % using de-excitation of atoms and ions in a plasma. These spectrometers are ideal for applications like mining, chemicals manufacturing, salt production, wear metals in oil analysis, petrochemical, metallurgical production and precious metal refining. ICP Spectrometers increase your lab productivity, with fast analysis time, less complicated methods, shorter warm-up time & better performance.
Forensic light sources from HORIBA are the ultimate units in their categories featuring the most wavelengths and highest intensity (best sensitivity in searching mode). Over the past 6 years 140 units were purchased by the FBI, 50 units by the National Japanese police, 25 units by the French Gendarmerie and 107 units by the Italian Carabinieri. There are more than 1000 units in use worldwide by police forces ranging from small City Police Dept's to counties, state and special crime scene forces to national and federal police agencies.
HORIBA provides single-channel detectors (SCDs) or multichannel detectors (MCDs). SCDs have one active sensing element that acts as single transducer. Photons reaching the detector, within its operating wavelength range, are absorbed by the active material of the detector and encoded as an electrical signal. The output signals produced include analog (voltage or current) and digital (pulse-counting) domains. MCDs have multiple active sensing areas which collect many wavelengths simultaneously at the focal plane of a spectrograph.