Elemental Analysis

Shimadzu’s Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES), also known as ICP-OES, provides a sophisticated technical platform for rapid, simultaneous multi-elemental analysis across a vast concentration range. Technically, these systems utilize a high-temperature argon plasma source to excite atoms and ions, which subsequently emit characteristic electromagnetic radiation as they return to lower energy states. 

Shimadzu’s Inductively Coupled Plasma Mass Spectrometry (ICP-MS) systems represent a pinnacle of elemental analysis, offering exceptional sensitivity and precision for trace and ultra-trace detection. Technically, these instruments combine a high-temperature argon plasma source with a sophisticated mass spectrometer to identify and quantify elements based on their mass-to-charge ratio. Engineered with advanced Analytical Intelligence.

Shimadzu’s ICP-MS software platform is technically engineered to streamline the entire elemental analysis workflow, from initial instrument setup to final data reporting. This sophisticated environment leverages "Analytical Intelligence" to automate labor-intensive tasks such as plasma tuning and mass calibration. The software’s core functionality resides in its ability to manage complex multi-elemental acquisition sequences while providing real-time diagnostic monitoring of critical parameters like vacuum levels and gas flows. 

Shimadzu’s Atomic Absorption Spectroscopy (AAS) platforms provide a technically robust solution for the precise determination of metallic elements in a wide variety of matrices. By utilizing flame atomization for parts-per-million (ppm) levels and graphite furnace atomization for parts-per-billion (ppb) sensitivity, these systems address a diverse range of analytical requirements in environmental, food safety, and industrial laboratories.

Wavelength Dispersive X-ray Fluorescence (WDXRF) spectroscopy represents a high-end technical solution for the most demanding elemental analysis tasks, providing superior spectral resolution and sensitivity compared to energy-dispersive systems. Technically, the instrument operates by using a high-power X-ray tube to excite the sample, followed by the physical separation of fluorescent X-rays using specialized analyzing crystals based on Bragg’s Law.

Shimadzu’s Energy Dispersive X-ray Fluorescence (EDXRF) spectroscopy provides a non-destructive technical method for the qualitative and quantitative determination of elements ranging from Carbon (C) or Sodium (Na) to Uranium (U). Technically, the process involves exciting a sample with primary X-rays, causing the emission of secondary fluorescent X-rays characteristic of the elements present. 

Shimadzu’s Optical Emission Spectroscopy (OES) systems, specifically spark-based OES, are technically engineered for the rapid and precise elemental determination of solid metal samples. Technically, the process involves generating a high-energy spark between an electrode and the metallic sample under an argon atmosphere, which vaporizes and excites the atoms. As these excited atoms return to their ground state, they emit characteristic light at specific wavelengths.