Advanced Focused Ion Beam

Tescan FIB-SEM systems for life science provide a versatile platform for high-resolution imaging and three-dimensional reconstruction of biological samples. By combining precise focused ion beam milling with advanced SEM imaging, these systems allow researchers to explore cellular and subcellular ultrastructures at the nanometer scale. Optimized vacuum conditions, cryogenic capabilities, and integrated detectors ensure the preservation of delicate biological materials while enabling detailed analysis.

Tescan FIB-SEM systems for materials science offer a versatile platform for nanoscale structural characterization, microanalysis, and targeted sample modification. By integrating high-resolution SEM imaging with precise focused ion beam milling, these systems enable detailed examination of material composition, morphology, and internal structures. Researchers can perform site-specific cross-sectioning, prepare thin lamellae for TEM analysis, and reconstruct complex three-dimensional microstructures.

Tescan FIB-SEM systems for semiconductor applications provide a precise and versatile platform for cross-sectioning, imaging, and analysis of nanoscale devices. By integrating high-resolution SEM imaging with accurate focused ion beam milling, these systems enable detailed inspection of multilayer structures, interconnects, and critical device features. Fast and controlled material removal, combined with advanced detector integration, ensures consistent, reproducible results for failure analysis, process development, and device characterization.

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