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VEGA for Material Science


With two chamber mounted detectors

Tescan VEGA for Material Science

TESCAN VEGA is equipped with two chamber mounted detectors: a secondary electron detector (SE) for topographical contrast and a backscattered electron detector (BSE) for material contrast  and has an optimum imaging and analytical conditions immediately available thanks to TESCAN’s unique apertureless optical design powered by In-flight Beam Tracing™. It is integrated with Essence™ EDS software that enhances magnifications as low as 2× due to the unique Wide Field Optics™ design. VEGA comes with optional vacuum buffer significantly reduces vacuum rotary pump run-time to deliver both ecological and economic benefits.


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